Testing cutting-edge optical components with cutting-edge technologies

5G telecommunication infrastructures around the globe rely heavily on photonic components, such as integrated photonics. These cutting-edge optical devices are present not only in the telecom landscape but are also considered for sensing, medical or quantum computing applications.

The spectral characterization of such components calls for new cutting-edge testing capabilities, going up a gear in testing speed without any compromise on accuracy or resolution.

In this presentation, I will showcase EXFO’s series of spectral testing solutions for active and passive optical components. I will focus on the CTP10 component testing platform, which is a fully integrated solution for spectral characterization. The latest modules available on the platform measure insertion loss and polarization dependent loss over an unprecedented wavelength range.

Key takeaways:

• High speed measurement with high accuracy and repeatability
• Integrated, easy to setup IL PDL solution
• Full telecom wavelength range
• Automation examples