Automated probe stations
Our test stations incorporate top-of-the-line equipment to ensure that requirements are met, whatever the situation. Build the best suited station for you, whether you're testing individual chips for R&D or even full production wafers. The adaptative test stations can handle any scenario, from individual chips to full production wafers. Equip it with RF probes, optical heads or any other equipment as needed.
2 products
OPAL-MD - Multi-die automated test station
Accurate, automated, fast testing of photonic integrated circuits (PIC) with traceable results.
OPAL-SD - Single-die semi-automated probe station
Entry-level, flexible, cost-effective and upgradeable. Automated optical alignment and test of photonic integrated circuits (PIC) with traceable results that can be queried. Manual positioning of die and electrical probes.