Resources
All resources
Flyers and pamphlets
Leading-edge transmission testing up to 800G - English
(October 26, 2021)
Flyers and pamphlets
Leading-edge transmission testing up to 800G - 中文
(October 26, 2021)
Flyers and pamphlets
Leading-edge transmission testing up to 800G - 日本語
(October 26, 2021)
Application notes
Testing next-gen PIC-based transceivers - English
(July 07, 2021)
Spec sheet
BA-4000 – RF cable and connectors - English
(July 02, 2021)
Spec sheet
BA-4000 – RF cable and connectors - 中文
(July 02, 2021)
Spec sheet
BA-4000 – RF cable and connectors - Français
(July 02, 2021)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - English
(June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 中文
(June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 日本語
(June 20, 2023)
Flyers and pamphlets
BA-4000 now with 800G FEC Generator and Checker (FGC) - English
(October 26, 2021)
Flyers and pamphlets
BA-4000 now with 800G FEC Generator and Checker (FGC) - 中文
(October 26, 2021)
Flyers and pamphlets
BA-4000 now with 800G FEC Generator and Checker (FGC) - 日本語
(October 26, 2021)
Flyers and pamphlets
EXFO demos - OIF interops - English
(March 18, 2022)
Flyers and pamphlets
PIC-Optical integrated circuits test solution - 日本語
(October 26, 2021)
Declaration of conformity
BA-4000 | CE - English
(June 29, 2021)
Product demos
800G bit-error-rate testing enhanced with FEC capabilities - English
(May 18, 2023)
Product demos
Leading-edge BER testing up to 800G - English
(May 18, 2023)