Resources
All resources
Blog
How to address challenges in the end-to-end qualification of pluggable transceivers? - English
(January 17, 2021)
Webinar
Still bogged down by issues when rolling out next-gen high speeds from R&D to manufacturing? - English
(May 16, 2023)
Application notes
Unveiling the secrets of 200G/400G optical transceivers - English
(March 20, 2020)
User manual
EA-4000 Eye Analyzer - English
(November 01, 2021)
Spec sheet
EA-4000 Eye Analyzer - English
(May 17, 2022)
Spec sheet
EA-4000 Eye Analyzer - 中文
(May 17, 2022)
Flyers and pamphlets
Leading-edge transmission testing up to 800G - English
(October 26, 2021)
Flyers and pamphlets
Leading-edge transmission testing up to 800G - 中文
(October 26, 2021)
Flyers and pamphlets
Leading-edge transmission testing up to 800G - 日本語
(October 26, 2021)
Application notes
Testing next-gen PIC-based transceivers - English
(July 07, 2021)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - English
(June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 中文
(June 20, 2023)
Flyers and pamphlets
Testing photonics and optical components for manufacturing, design and research challenges - 日本語
(June 20, 2023)
Flyers and pamphlets
EA-4000 sampling scope - English
(April 21, 2022)
Flyers and pamphlets
PIC-Optical integrated circuits test solution - 日本語
(October 26, 2021)