Resources
All resources
Flyers and pamphlets
PIC-Optical integrated circuits test solution - 日本語
(October 26, 2021)
Application notes
Characterization of spectrally fine responses of optical passive devices - English
(October 25, 2023)
Application notes
Characterization of spectrally fine responses of optical passive devices - 日本語
(October 25, 2023)
Application notes
Characterization of spectrally fine responses of optical passive devices - 中文
(October 25, 2023)
Application notes
Insertion loss and return loss: relative measurements using the CTP10 platform - English
(March 27, 2023)
Application notes
Swept IL PDL measurement of WDM components with the CTP10 platform - English
(March 28, 2023)
White papers
Navigating the murky waters of swept PDL measurements - English
(February 25, 2021)
Spec sheet
T200S - English
(August 05, 2024)
Spec sheet
T200S - Français
(August 05, 2024)
Spec sheet
T200S - 中文
(August 05, 2024)
Flyers and pamphlets
Optiwave and EXFO - Partners for automation in lab and manufacturing - English
(September 30, 2022)
Product demos
An overview of EXFO Optics product portfolio - English
(May 18, 2023)
Product demos
EXFO's CTP10: Overview of the GUI for swept IL-PDL measurements - English
(May 18, 2023)
Product demos
Is your optical component testing future-proof? - English
(May 18, 2023)