Technical documentation
Spec sheets, reference guides, white papers. Find all you need to learn more about our test orchestration and real-time 3D analytics solutions.
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Application notes
Wander-A Critical Parameter for Network Synchronization - English
(August 21, 2011)
Application notes
Accurately Measure Laser Spectral Characteristics - English
(August 21, 2011)
Application notes
ORL Measurements in Field Applications - English
(August 21, 2011)
Application notes
Characterizing Polarization-Dependent Wavelength in AWGs and PLCs - English
(August 21, 2011)
Application notes
Wavelength Meter Theory: Michelson Interferometry - English
(August 21, 2011)
Application notes
New OSA 40 Gbit/s Software Function - English
(August 21, 2011)
Application notes
Locating Faults With a TDR - English
(August 21, 2011)
Application notes
2600B Series Tunable Laser Sources: Wavelength Uncertainty and User Calibration Procedures - English
(August 21, 2011)
Application notes
Ensuring the Availability and Reliability of Dark-Fiber Networks - English
(August 21, 2011)
Application notes
DFL-5720 Digital Frequency-Locking System: Simplifying Wavelength-Locker Testing - English
(August 21, 2011)