Skip to main content

Search results


AXS - Compact OTDR Series

The accuracy, reliability and durability of EXFO’s OTDRs in a compact design for the field.

Products
intelligent Optical Link Mapper (iOLM)

Simplify OTDR tests while optimizing characterization accuracy for all network topologies. iOLM is powered by intelligent algorithms that can adapt to the context. Still unmatched in the industry, iOL...

Resources
How EXFO and Sunsight provide a unified solution for efficient wireless network management Resources
FIP-200 Fiber inspection Tool Resources
PIC Testing Pages
Passive component characterization

Main specifications for filters and broadband components

Resources
Optical testing solutions for manufacturing and R&D

Optical testing solutions for manufacturing and R&D

Resources
Optical testing solutions for universities and labs

Explore our industry-leading portfolio of optical testing solutions for universities and laboratory applications.

Resources
See it first at OFC 2025! Pages
See the revolution in PIC edge-coupling at wafer-scale

This short video demonstrates how EXFO provides the industry’s only industrial solution for edge-coupling at wafer-scale by uniquely providing multiport testing using a plane of incidence parallel to circuit plane, essential for true industrial scalability. The Test Plan Execution is shown while performing automatic edge-coupled wafer testing using EXFO’s industry-leading OPAL-EC probe station and PILOT software. The Results Manager application is also explored.

Resources